High-voltage transistor having shielding gate

ABSTRACT

A semiconductor device includes a plurality of high-voltage insulated-gate field-effect transistors arranged in a matrix form on the main surface of a semiconductor substrate and each having a gate electrode, a gate electrode contact formed on the gate electrode, and a wiring layer which is formed on the gate electrode contacts adjacent in a gate-width direction to electrically connect the gate electrodes arranged in the gate-width direction. And the device includes shielding gates provided on portions of an element isolation region which lie between the transistors adjacent in the gate-width direction and gate-length direction and used to apply reference potential or potential of a polarity different from that of potential applied to the gate of the transistor to turn on the current path of the transistor to the element isolation region.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a division of and claims the benefit of priorityunder 35 U.S.C. §120 from U.S. Ser. No. 11/510,584 filed Aug. 28, 2006,which a division of U.S. Pat. No. 7,119,413 issued Oct. 10, 2006, andclaims the benefit of priority under 35 U.S.C. §119 from Japanese PatentApplication No. 2004-239593 filed Aug. 19, 2004, the entire contents ofeach of which are incorporated herein by reference.

BACKGROUND OF THE INVENTION

1. Field of the Invention

This invention relates to a semiconductor device and more particularlyto a high-voltage transistor or the like provided in a core portion ofthe row decoder of a NAND flash memory, for example.

2. Description of the Related Art

Conventionally, for example, in high-voltage transistors and the like,electric lines of force extend into the element isolation insulatingfilm disposed between the adjacent transistors to make unstable thepotentials of the gate and source/drain of the adjacent transistor. Inthis state, if a high-voltage is applied, an inversion layer occurs inthe interface between the element isolation insulating film and thesemiconductor substrate and extends to the adjacent transistor. As aresult, a phenomenon that a current flows between the transistors, thatis, a so-called field inversion occurs.

In order to prevent occurrence of the field inversion, it is necessaryto increase the depth of the element isolation insulating film disposedbetween the high-voltage transistors and the distance between thetransistors. Therefore, it is disadvantageous for miniaturization.

For example, in FIG. 3(d) of Jpn. Pat. Appln. KOKAI Publication No.4-199658, an example is disclosed in which an isolation transistor isprovided between adjacent high-voltage transistors and elements areisolated by cutting off the isolation transistor to prevent occurrenceof field inversion.

However, in the above example, it is necessary to provide the isolationtransistors, and therefore, the area is increased due to the presence ofthe isolation transistors and it is still disadvantageous forminiaturization.

BRIEF SUMMARY OF THE INVENTION

According to an aspect of the present invention, there is provided asemiconductor device comprising a plurality of high-voltageinsulated-gate field-effect transistors arranged in a matrix form on amain surface of a semiconductor substrate and each having a gateelectrode, a gate electrode contact formed on the gate electrode, and awiring layer which is formed on the gate electrode contacts adjacent ina gate-width direction to electrically connect the gate electrodes inthe gate-width direction; and shielding gates which are provided on anelement isolation region in spaces between the transistors adjacent inthe gate-width direction and gate-length direction and used to apply oneof reference potential and potential of a polarity different from thatof potential applied to the gate of the transistor to turn on a currentpath of the transistor to the element isolation region.

According to an aspect of the present invention, there is provided asemiconductor device comprising a plurality of high-voltageinsulated-gate field-effect transistors arranged in a matrix form on amain surface of a semiconductor substrate and having gate electrodesformed to extend in a gate-width direction, the transistors arranged inthe gate-width direction commonly having a corresponding one of the gateelectrodes; first shielding gates provided on portions of an elementisolation region which lie between the transistors adjacent in thegate-width direction; and second shielding gates provided on portions ofan element isolation region which lie between the transistors adjacentin the gate-length direction; wherein the first and second shieldinggates are different from portions of the element isolation region onwhich the gate electrodes are formed and used to apply one of areference potential and a potential of a polarity different from that ofpotential applied to the gate of the transistor to turn on a currentpath of the transistor to the element isolation region; and the firstshielding gates connect the second shielding gates.

According to still another aspect of the present invention, there isprovided a semiconductor device comprising a plurality of high-voltageinsulated-gate field-effect transistors arranged in a matrix form on amain surface of a semiconductor substrate and each having a gateelectrode, a gate electrode contact formed on the gate electrode, and awiring layer which is formed on the gate electrode contacts adjacent ina gate-width direction to electrically connect the gate electrodes inthe gate-width direction; and shielding gates provided on portions of anelement isolation region which lie between the transistors adjacent inthe gate-width direction and used to apply one of reference potentialand potential of a polarity different from that of potential applied tothe gate of the transistor to turn on a current path of the transistorto the element isolation region.

BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWING

FIG. 1 is a plan view schematically showing a semiconductor deviceaccording to a first embodiment of this invention;

FIG. 2 is a plan view schematically showing high-voltage transistors ina core portion of the row decoder of the semiconductor device accordingto the first embodiment of this invention;

FIG. 3 is a cross-sectional view taken along the 3-3 line of FIG. 2;

FIG. 4 is a cross-sectional view taken along the 4-4 line of FIG. 2;

FIG. 5 is a plan view for illustrating the operation of the high-voltagetransistors of the semiconductor device according to the firstembodiment;

FIG. 6 is a plan view for illustrating the operation of the high-voltagetransistors of the semiconductor device according to the firstembodiment;

FIG. 7 is a cross-sectional view schematically showing high-voltagetransistors of the semiconductor device according to a modification 1 ofthis invention;

FIG. 8 is a plan view schematically showing high-voltage transistors ofa semiconductor device according to a second embodiment of thisinvention;

FIG. 9 is a cross-sectional view taken along the 9-9 line of FIG. 8;

FIG. 10 is a plan view schematically showing high-voltage transistors ofa semiconductor device according to a third embodiment of thisinvention;

FIG. 11 is a diagram schematically showing the relation between thethreshold voltage Vth and the width W in the gate-length direction ofthe high-voltage transistor of the semiconductor device according to thethird embodiment of this invention; and

FIG. 12 is a plan view schematically showing high-voltage transistors ofthe semiconductor device according to a modification 2 of thisinvention.

DETAILED DESCRIPTION OF THE INVENTION

There will now be described embodiments of this invention with referenceto the accompanying drawings. In this explanation, common referencesymbols are attached to like portions throughout the drawings.

First Embodiment

First, a semiconductor device according to a first embodiment of thisinvention is explained with reference to FIGS. 1 to 6 by taking a NANDflash memory as an example. FIG. 1 is a plan view schematically showinga memory cell array and a peripheral circuit thereof in the NAND flashmemory.

As shown in FIG. 1, a NAND flash memory 11 includes a row decoder 12,memory cell array 13, sense amplifier 14 and source line driver 15.

The row decoder 12 is configured to select one of word lines WL1 to WL8and selection select gate lines SGD, SGS. Further, the row decoder 12includes a row main decoder circuit portion 16 and core portion (row subdecoder portion) 17. The row main decoder circuit portion 16 decodes arow address signal to supply a row address decode signal to the coreportion 17. The core portion 17 includes transfer gate transistors TGTD,TGTS and high-voltage transistors TR1 to TR8 having gates commonlyconnected to a transfer gate line TG.

The memory cell array 13 has a plurality of NAND cells 18 arranged in amatrix form. Each of the NAND cells 18 includes eight memory celltransistors MT and selection transistors ST1, ST2. The memory celltransistor MT has a laminated structure which includes a floating gateformed above the main surface of a semiconductor substrate with a gateinsulating film disposed therebetween, a gate-gate insulating filmformed on the floating gate, and a control electrode formed on thegate-gate insulating film (not shown). Every two adjacent memory celltransistors MT commonly have the source/drain. The memory celltransistors are arranged so that the current paths thereof will beserially connected between the selection transistors ST1 and ST2. Thenumber of memory cell transistors MT is not limited to eight and can beset to 16, 32, for example. Further, both of the selection transistorsST1, ST2 are not always necessary. If one of the NAND cells 18 can beselected, only one of the selection transistors ST1 and ST2 can beprovided.

The control electrodes of the memory cell transistors MT arranged on thesame column are commonly connected to a corresponding one of the wordlines WL1 to WL8. Further, the gates of the selection transistors ST1,ST2 on the same row are respectively and commonly connected to theselect gates SGD, SGS. The drains of the selection transistors ST1 onthe same row are connected to a corresponding one of bit lines BL1 toBLn. The sources of the selection transistors ST2 are commonly connectedto the source line driver 15 via a source line SL.

The sense amplifier 14 is configured to amplify data read out from aselected one of the memory cell transistors MT.

The source line driver 15 is configured to apply voltage to the sourceline SL.

Next, the high-voltage transistors TR1 to TR8 of the core portion 17 areexplained by taking the transistors TR1 to TR4 as an example withreference to FIGS. 2 to 7.

FIG. 2 is a plan view schematically showing the high-voltage transistorsTR1 to TR4. FIG. 3 is a cross-sectional view taken along the 3-3 line ofFIG. 2. FIG. 4 is a cross-sectional view taken along the 4-4 line ofFIG. 2.

As shown in the drawing, the high-voltage transistors TR1 to TR4 areformed in respective element regions AA which are isolated by an elementisolation region STI (shallow trench isolation region) formed on themain surface of a semiconductor substrate 21.

The transistors TR1 to TR4 respectively have gate insulating films 23formed on the substrate 21, floating electrode layers 24 formed on therespective gate insulating films 23, control electrode layers 25 formedon the respective floating electrode layers 24 and sources S1 toS4/drains D1 to D4 which are isolated from one another and arranged tosandwich the corre-sponding gate electrodes. Contacts are formed on therespective sources S1 to S4 and drains D1 to D4 to apply desiredpotentials thereto. For example, as shown in FIG. 4, drain contacts DCare formed to penetrate through the insulating layer 28, floatingelectrode layers and gate insulating films 23 to reach the surface ofthe substrate 21 and electrically connected to a wiring layer DL. Asdescribed above, the transfer gate line TG is configured by the controlelectrode layer 25. For example, the floating electrode layer 24 andcontrol electrode layer 25 are formed of polysilicon.

The floating electrode layers 25 are isolated for the respectivetransistors TR1 to TR4 and formed on the element regions AA. Gateelectrode contacts 26 are formed on portions (fringe portions) which areformed by extending the floating electrode layer 25 in the gate-widthdirection onto the element isolation region STI. Each of wiring layers27 is formed on the gate electrode layers 26 on the control electrodelayers 25 which are adjacent to each other in the gate-width directionso as to electrically connect the transfer gate lines TG arranged in thegate-width direction.

Further, shielding gates 31 are formed on portions of the elementisolation region STI which lie between the transistors TR1 to TR4adjacent to one another in the gate-length direction and gate-widthdirection. In other words, the shielding gates 31 are formed to surroundthe transistors TR1 to TR4 on the element isolation region STI. Theshielding gate 31 is grounded and applied with 0V or applied with presetnegative bias voltage.

The shielding gate 31 may be formed only in one of the gate-lengthdirection and gate-width direction.

Further, the control electrode layer 25 are electrically connected tothe transfer gate line TG via a wiring layer (not shown). The contactsof the sources S1 to S4 and drains D1 to D4 are applied with desiredpotentials via wiring layers (not shown).

<Operation (Self-Boost Method)>

Next, the operation of the high-voltage transistors TR1 to TR8 in a casewhere data is programmed into the memory cell transistor MT by use ofthe self-boost method is explained below. The program operation issimultaneously performed for all of the memory cell transistors MT (onePAGE) connected to a corresponding one of the word lines WL1 to WL8. Acase wherein data is programmed into the memory cell transistor MT2shown in FIG. 1 is explained by using the transistors TR1, TR2. FIGS. 5and 6 are plan views for illustrating the operation of the transistorsTR1, TR2.

First, a voltage of 0V is applied to the bit line BL1 and Vcc is appliedto the bit lines BL2 to BLn to select one of the NAND cells 18 which isconnected to the bit line BL1.

Then, as shown in FIG. 5, before the transfer gate line TG is selected,the transistors TR1, TR2 are set in the OFF state and the sources S1, S2are applied with no potential (0V) or set in an electrically floatingstate. Next, in order to select the memory cell transistor MT which isconnected to the word line WL2, program voltage Vpgm (which isapproximately 25V, for example) which is supplied from part Dec16-2 ofthe row main decoder circuit portion 16 is applied to the drain D2. Atthis time, since the transistor TR1 which is adjacent to the transistorTR2 in the gate-width direction with part of the element isolationregion STI disposed therebetween is not selected, voltage is notsupplied from part Dec16-1 of the row main decoder circuit portion 16and no voltage is applied to the drain D1 (0V).

With the above bias relation, high-voltage (which is approximatelyprogram voltage Vpgm) is applied to a space region 35 of the elementisolation region between the drains D1 and D2. A shielding gate 31 whichis applied with 0V or negative potential is formed on the space region35 of the element isolation region between the drains D1 and D2. Thus, asufficiently high degree of element isolation is attained in the spaceregion 35 of the element isolation region and occurrence of a so-calledpunchthrough leak is prevented.

Next, intermediate potential Vpass is applied to the drain D1. Further,potential VpgmH (which is equal to Vpgm+Vth, for example, approximately26V) used to transfer program voltage Vpgm to the word line WL2 isapplied to the transfer gate line TG. By application of the potentialVpgmH, the transistors TR1, TR2 are turned on. Then, the intermediatepotential Vpass and program voltage Vpgm are respectively transferred tothe word line WL1 (non-selected word line) and word line WL2 (selectedword line).

With the above bias relation, the high-voltage Vpgm is applied to aspace region 37 of the element isolation region which lies below thetransfer gate line TG extending in the gate-width direction. A shieldinggate 31 which is applied with 0V or negative potential is formed on thespace region 37 of the element isolation region. Thus, occurrence of aphenomenon that a channel is formed in the space region 37 of theelement isolation region and a current flows therethrough, that is,so-called field inversion, is prevented.

Further, the transfer gate transistors TGTD, TGTS are also turned on byapplication of the potential VpgmH. Then, potential Vcc is transferredto the selected select gate line SGD and 0V is transferred to thenon-selected select gate line SGS. The operations of the othertransistors TR3 to TR8 are the same as that of the transistor TR1.

Therefore, the transistor ST1 and memory cell transistor MT1 to whichthe potential Vcc and intermediate potential Vpass are transferred areturned on. Thus, potential 0V of the bit line BL1 is applied to thesubstrate in which the memory cell transistor MT2 is formed. Further,electrons are injected into the floating electrode (not shown) of thememory cell transistor by applying program voltage Vpgm transferred tothe control gate (not shown) of the memory cell transistor MT2. Thus,the program operation is performed.

As described above, in the semiconductor device according to the presentembodiment, the shielding gates 31 which apply 0V or negative potentialto the element isolation region STI are formed on portions of theelement isolation region STI between the transistors TR1 to TR4 whichare adjacent in the gate-length direction and gate-width direction.

Therefore, even in a case where the high-voltage (which is approximatelyequal to the program voltage Vpgm) is applied to the space region of theelement isolation region between the drains D1 and D2 (FIG. 5) or wherethe high potential VpgmH is applied to the space region 37 of theelement isolation region which lies below the transfer gate lines TG inthe gate-width direction (FIG. 6), occurrence of inversion layers in thespace regions 35, 37 is prevented. Thus, occurrence of field inversionand occurrence of a punchthrough leak can be prevented. Therefore,occurrence of a short circuit and extra power consump-tion due to thefield inversion and punchthrough leak can be suppressed and thereliability can be enhanced.

Further, the above effect can be attained not only in the space betweenthe transistors which are adjacent in the gate-width direction but alsoin the space between the transistors (for example, the space between thetransistors TR1 and TR3 and the space between the transistors TR2 andTR4) which are adjacent in the gate-length direction if the same biasrelation is set.

Since the degree of element isolation is enhanced by the above effect,it is not necessary to increase the distances of the element isolationregion STI between the transistors TR1 to TR4 which are adjacent in thegate-length direction and gate-width direction. Therefore, the area ofthe element isolation region STI in the gate-length direction andgate-width direction can be reduced and is advantageous forminiaturization.

As a result, the cell area of the core portion 17 can be reduced. Inthis case, the rate of the cell area of the core portion 17 whichoccupies the whole area of the NAND flash memory 11 is high. Therefore,the factor of the core portion 17 which is advantageous forminiaturization is advantageous for a reduction in the cell area of theNAND flash memory 11.

The control electrode layers 25 are isolated for the respectivetransistors TR1 to TR4. The control electrode layers 25 of thetransistors TR which are adjacent in the gate-width direction areelectrically connected to each other via the wiring layer 27 and thegate electrode contacts 26 having the length H1.

Therefore, the effective depth of the element isolation region STI canbe increased by H1 and the reliability can be enhanced by enhancing thedegree of element isolation.

As described above, by positively forming the shielding gates 31 onportions of the element isolation region STI which lie between thetransistors TR1 to TR4 adjacent to one another in the gate-lengthdirection and gate-width direction, the punchthrough leak and fieldinversion can be prevented and the reliability can be enhanced.

Further, the gate electrode contacts 26 are formed on portions (fringeportions) which are formed by extending the floating electrode layer 25in the gate-width direction onto the element isolation region STI.

Therefore, it is advantageous in preventing the floating electrode layer24 from being etched and damaged when the gate electrode contacts 26 areformed in the insulating layer 28 by use of an anisotropic etchingprocess such as an RIE (reactive ion etching) process, for example.

[Modification 1]

Next, a semiconductor device according to a modification 1 of thisinvention is explained with reference to FIG. 7. In the followingexplanation, the explanation for portions which are the same as those ofthe first embodiment is omitted. FIG. 7 is a cross-sectional viewschematically showing the semiconductor device according to themodification 1 and is a cross-sectional view taken in the same directionas that of FIG. 3.

As shown in FIG. 7, in the semiconductor device according to themodification 1, gate electrode contacts 26 are formed on gate electrodes(the control electrode layers 25) on element regions AA.

With the above configuration, the same effect as that of the firstembodiment can be attained. Further, in the semiconductor deviceaccording to the modifica-tion 1, the gate electrode contacts 26 areformed on gate electrodes (the control electrode layers 25) on theelement regions AA. Therefore, the fringe portions in the gate-widthdirection can be made small by not forming the gate electrode contacts26 on so-called fringe portions of the control gates 25. As a result,the cell area in the gate-width direction can be reduced and isadvantageous for miniaturization.

Further, since the distance between the gate electrode contacts 26 whichare adjacent in the gate-width direction can be set long to a certainextent, voltage applied from the gate electrode contact 26 to theelement isolation region STI can be lowered. In addition, it isadvantageous in preventing potentials of transistors which are adjacentin the gate-width direction from becoming unstable.

Second Embodiment

Next, a semiconductor device according to a second embodiment of thisinvention is explained with reference to FIGS. 8 and 9. In the followingexplanation, the explanation for portions which are the same as those ofthe first embodiment is omitted. FIG. 8 is a plan view schematicallyshowing the semiconductor device according to the second embodiment.FIG. 9 is a cross-sectional view taken along the 9-9 line of FIG. 8.

In the semiconductor device according to the second embodiment,transistors TR1-TR2 and transistors TR3-TR4 which are arranged in thegate-width direction are formed to respectively and commonly havecontrol electrode layers 45. Therefore, the gate electrode contacts 26formed in the semiconductor device according to the first embodiment arenot formed in the second embodiment.

Further, shielding gates 41-1, 41-2 are formed on portions of theelement isolation region STI for the transistors TR1 to TR4 which areadjacent in the gate-length direction and gate-width direction exceptportions of the element isolation region on which the control electrodelayers 45 are formed. In other words, the shielding gates 41-1, 41-2 areformed to surround the transistors TR1 to TR4 on portions of the elementisolation region other than portions of the element isolation region onwhich the control electrode layers 45 are formed. The shielding gate41-1, 41-2 is used to apply 0V or preset negative bias voltage to theportions of the element isolation region other than portions of theelement isolation region on which transfer gate lines TG are formed.Further, the control electrode layers 45 are electrically connected tothe transfer gate lines TG (not shown).

With the above configuration, the same effect as that of the firstembodiment can be attained. Further, the shielding gates 41-1, 41-2 areformed on portions of the element isolation region STI for thetransistors TR1 to TR4 which are adjacent in the gate-length directionand gate-width direction except the portions of the element isolationregion on which the control electrode layers 45 are formed. In addition,the shielding gate 41-1, 41-2 is used to apply 0V or preset negativebias voltage to the portions of the element isolation region other thanthe portions of the element isolation region on which the controlelectrode layers 45 are formed.

Therefore, occurrence of the so-called punchthrough leak and fieldinversion can be prevented by the same action as described above. As aresult, the reliability can be enhanced.

Further, the shielding gate 41-1, 41-2 is not formed on portions of theelement isolation region STI on which transfer gate lines TG are formed.Therefore, even in a case where the distance between the transistorsTR1-TR2 and transistors TR3-TR4 which are adjacent in the gate-widthdirection cannot be set sufficiently long, it is possible to prevent thecontrol electrode layer 45 and shielding gate 41-1, 41-2 from beingbrought into contact with each other and causing a short circuit.Further, even if the distance between the transistors TR1-TR2 andtransistors TR3-TR4 which are adjacent in the gate-width direction isshort, the insulating property can be enhanced. Therefore, it isadvantageous in reducing the cell area in the gate-width direction.

Further, the transistors TR1-TR2 and transistors TR3-TR4 arranged in thegate-width direction commonly have the control electrode layers 45.Therefore, it is not necessary to provide the gate electrode contacts 26as in the first embodiment. As a result, the semiconductor device can beeasily formed and it is advantageous in lowering the manufacturing cost.

Third Embodiment

Next, a semiconductor device according to a third embodiment of thisinvention is explained with reference to FIGS. 10 and 11. In thefollowing explanation, the explanation for portions which are the sameas those of the first, second embodiments and the modification 1 isomitted. FIG. 10 is a plan view schematically showing the semiconductordevice according to the third embodiment. FIG. 11 is a diagramschematically showing the relation between the threshold voltage Vth andthe width W in the gate-length direction of a control electrode layer 45of the semiconductor device according to the third embodiment.

In the semiconductor device according to the third embodiment,transistors TR1-TR2 and transistors TR3-TR4 which are arranged in thegate-width direction are formed to commonly have the control electrodelayers 45. The control electrode layers 45 each have a portion 55 whosewidth W is made small in the gate-length direction on an elementisolation region STI. Further, shielding gates 41 have arm portions 59which are formed to extend in the gate-length direction to positionsnear the portions 55.

With the above configuration, the same effect as that of the secondembodiment can be attained. Further, in the semiconductor deviceaccording to the third embodiment, the control electrode layers 45 areformed to have the portions 55 whose width W is made small. In thiscase, if the length of the control electrode layer 45 in the gate-widthdirection is set to L and the width thereof in the gate-length directionis set to W, then the width W can be set small and the length L can beset constant as in the semiconductor device according to the secondembodiment. Therefore, the threshold voltage Vth can be enhanced by theso-called narrow channel effect as shown in FIG. 11. As a result,occurrence of field inversion can be more stably prevented and thereliability can be enhanced.

Further, the shielding gate 41 has the arm portions 59 which are formedto extend in the gate-length direction to positions near the portions55. Therefore, since the shielding gate 41 can be formed nearer to aportion of the element isolation region STI in which field inversion mayoccur, occurrence of field inversion can be more stably prevented andthe reliability can be enhanced.

[Modification 2]

Next, a semiconductor device according to a modification 2 of thisinvention is explained with reference to FIG. 12. In the followingexplanation, the explanation for portions which are the same as those ofthe first, second embodiments and the modification 1 is omitted. FIG. 12is a plan view showing the semiconductor device according to themodification 2.

As shown in FIG. 12, in the semiconductor device according to thepresent modification, shielding gates 31 are formed only on portions ofan element isolation region STI which correspond to spaces betweentransistors (TR1 and TR2, TR3 and TR4) which are adjacent in thegate-width direction.

Therefore, the withstand voltage against field inversion which may occurwith the strongest possibility in a space portion between thetransistors in the gate-width direction can be enhanced.

Further, shielding gates 31 are not formed on portions of the elementisolation region STI which correspond to spaces between the transistors(TR1 and TR3, TR2 and TR4) which are adjacent in the gate-lengthdirection.

Therefore, it is advantageous that the cell area in the gate-lengthdirection can be reduced because the shielding gates 31 are not formed.

In the first to third embodiments and the modifications 1, 2, the N-typehigh-voltage MOS field effect transistors (MOSFETs: metal oxidesemiconductor field-effect transistors) TR1 to TR8 formed in the coreportion 17 of the row decoder 12 of the NAND flash memory are explainedas an example. However, it is also possible to apply this invention toP-type transistors. In a case where this invention is applied to theP-type transistors, a voltage applied to the shielding gates 31 is apositive bias voltage (voltage of a polarity different from that of avoltage applied to the gate to turn on the current path of thetransistor) or reference voltage. Further, this invention can be appliednot only to the row decoder but also to high-voltage insulated-gatefield-effect transistors formed in a portion different from the rowdecoder.

Further, this invention is not limited to the NAND type circuit and canbe applied to high-voltage MOS field effect transistors formed in a coreportion of a row decoder of a NOR flash memory.

Additional advantages and modifications will readily occur to thoseskilled in the art. Therefore, the invention in its broader aspects isnot limited to the specific details and representative embodiments shownand described herein. Accordingly, various modifications may be madewithout departing from the spirit or scope of the general inventiveconcept as defined by the appended claims and their equivalents.

1. A semiconductor device comprising: a plurality of high-voltageinsulated-gate field-effect transistors arranged in a matrix form on amain surface of a semiconductor substrate and each having a gateelectrode, a gate electrode contact formed on the gate electrode, and awiring layer which is formed on the gate electrode contacts adjacent ina gate-width direction to electrically connect the gate electrodesarranged in the gate-width direction; and shielding gates provided onportions of an element isolation region which lie between thetransistors adjacent in the gate-width direction and used to apply oneof a reference potential and a potential of a polarity different fromthat of a potential applied to the gate of the transistor to turn on acurrent path of the transistor to the element isolation region.
 2. Thesemiconductor device according to claim 1, wherein the gate electrodecontacts are formed on fringe portions formed by extending end portionsof the gate electrodes onto the element isolation region in thegate-width direction.
 3. The semiconductor device according to claim 1,wherein the high-voltage insulated-gate field-effect transistors areprovided in a core portion of a row decoder formed near a memory cellarray.
 4. The semiconductor device according to claim 3, wherein thememory cell array includes a plurality of memory cell transistors whicheach have a laminated structure having a floating electrode, a gate-gateinsulating film formed on the floating electrode, and a controlelectrode formed on the gate-gate insulating film, every adjacent two ofthe transistors commonly having a source/drain and current paths thereofbeing serially connected, and the plurality of high-voltageinsulated-gate field-effect transistors supply program voltages to thecontrol electrodes of the plurality of memory cell transistors.